JPH082627Y2 - 半導体試験装置の冷却構造 - Google Patents

半導体試験装置の冷却構造

Info

Publication number
JPH082627Y2
JPH082627Y2 JP151490U JP151490U JPH082627Y2 JP H082627 Y2 JPH082627 Y2 JP H082627Y2 JP 151490 U JP151490 U JP 151490U JP 151490 U JP151490 U JP 151490U JP H082627 Y2 JPH082627 Y2 JP H082627Y2
Authority
JP
Japan
Prior art keywords
power supply
air
board
cooling fan
supply unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP151490U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0393782U (en]
Inventor
昌明 柳沢
寛 塚原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP151490U priority Critical patent/JPH082627Y2/ja
Publication of JPH0393782U publication Critical patent/JPH0393782U/ja
Application granted granted Critical
Publication of JPH082627Y2 publication Critical patent/JPH082627Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Cooling Or The Like Of Electrical Apparatus (AREA)
JP151490U 1990-01-10 1990-01-10 半導体試験装置の冷却構造 Expired - Lifetime JPH082627Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP151490U JPH082627Y2 (ja) 1990-01-10 1990-01-10 半導体試験装置の冷却構造

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP151490U JPH082627Y2 (ja) 1990-01-10 1990-01-10 半導体試験装置の冷却構造

Publications (2)

Publication Number Publication Date
JPH0393782U JPH0393782U (en]) 1991-09-25
JPH082627Y2 true JPH082627Y2 (ja) 1996-01-29

Family

ID=31505418

Family Applications (1)

Application Number Title Priority Date Filing Date
JP151490U Expired - Lifetime JPH082627Y2 (ja) 1990-01-10 1990-01-10 半導体試験装置の冷却構造

Country Status (1)

Country Link
JP (1) JPH082627Y2 (en])

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005346123A (ja) 2004-05-31 2005-12-15 Toshiba Corp パラレルインタフェースコネクタを備えたストレージ装置及び同装置に適用される変換コネクタ
JP2006338189A (ja) 2005-05-31 2006-12-14 Toshiba Corp 情報処理装置、およびその制御方法
JP2014048201A (ja) * 2012-08-31 2014-03-17 Advantest Corp 電子部品試験装置
JP2014048202A (ja) * 2012-08-31 2014-03-17 Advantest Corp 電子部品試験装置

Also Published As

Publication number Publication date
JPH0393782U (en]) 1991-09-25

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term